METAS provides proficiency testing in EMC (Electro-Magnetic compatibility) according to ISO 17043.
The EMC Laboratory of METAS has acquired a considerable international experience in organising comparisons and evaluating round robin test devices (see publications).
Test
|
Standard |
Bilateral |
Interlaboratory |
---|---|---|---|
Conducted Emission Simple (single interface) |
CISPR 16 |
yes |
- |
Conducted Emission Complex (three interfaces) | CISPR 16/32 | yes | - |
Radiated Emission |
CISPR 16/32 |
yes |
yes |
Radiated Emission |
CISPR 16/32 |
yes |
- |
Radiated Immunity | IEC 61000-4-3 | yes | - |
Burst Immunity (NEW) | IEC 61000-4-4 | yes | yes |
Conducted Immunity |
IEC 61000-4-6 |
yes |
yes |
Surge Immunity | IEC 61000-4-5 | yes | yes |
METAS has developed round robin test devices for the following tests:
Conducted Emission (simple EUT) | CISPR 16/32 | |
Conducted Emission (complex EUT) | CISPR 16/32 | |
Radiated Emission (simple EUT) | CISPR 16/32 | |
Radiated Emission (complex EUT) | CISPR 16/32 | |
Conducted Immunity | IEC 61000-4-6 | |
Radiated Immunity | IEC 61000-4-3 | |
Surge Immunity | IEC 61000-4-5 | |
Burst Immunity | IEC 61000-4-4 |
Service for EMC capability assessment
In order to assess the EMC test capabilities of your laboratory, the round robin devices of METAS are available for bilateral comparison.
For more information please contact us (emc@metas.ch).
Publications
-
Emrah Tas, et al., "Design, Implementation, and Evaluation of Proficiency Testing in EMC Conducted Immunity", IEEE Transactions on Electromagnetic Compatibility, Vol. 59, Issue 5, pp. 1433-1440, 2017.
-
Frédéric Pythoud, "Proficiency Testing in EMC Radiated Immunity", IEEE Transactions on Electromagnetic compatibility, Vol. 60, Issue 5, pp.1249-1253, 2018
-
Emrah Tas, et al. "Design, Implementation and Evaluation of Proficiency Testing in EMC Surge Immunity", IEEE Transactions on Electromagnetic Compatibility, Vol. 62, Issue 6, pp. 2368 – 2375, 2020.
-
Proficiency testing - a fact based demonstration (PDF, 666 kB, 06.07.2020)
Frédéric Pythoud, Emrah Tas, "Proficiency testing - La démonstration par les faits!" METinfo_1_2017, p. 9-12
Last modification 24.09.2024
Contact
Federal Institute of Metrology
Laboratory Electromagnetic Compatibility
Lindenweg 50
CH-3003
Bern-Wabern
T
+41 58 387 01 11